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2 edition of Radiation effects in semiconductor devices found in the catalog.

Radiation effects in semiconductor devices

F. Larin

Radiation effects in semiconductor devices

  • 319 Want to read
  • 17 Currently reading

Published by Wiley .
Written in English


Edition Notes

Statementby F. Larin.
ID Numbers
Open LibraryOL21159095M


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Radiation effects in semiconductor devices by F. Larin Download PDF EPUB FB2

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This site is like a library, Use search box in the widget to get ebook that you want. In the modern semiconductor industry, there is a growing need to understand and combat potential radiation damage problems.

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Pages Brand: Springer US. Radiation effects in semiconductors and semiconductor devices. New York: Consultants Bureau, © (OCoLC) Document Type: Book: All Authors / Contributors: V S Vavilov; Nikolaĭ Andreevich Ukhin.

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The book examines data on radiation effects in semiconductor devices such as p-n junctions, diodes, laser emitting diodes, bipolar transistors and thyristors, MOS structures, and integrated circuits, and discusses models for explaining these effects. Topics investigated include stable changes in the current-voltage characteristics of p-n junctions under irradiation, effect of.

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Claeys, E. Simoen This wide-ranging book summarizes the current knowledge of radiation defects in semiconductors, outlining the shortcomings of present experimental and modelling techniques and giving an outlook on future developments.

Ionizing Radiation Effects in Electronics: From Memories to Imagers delivers comprehensive coverage of the effects of ionizing radiation on state-of-the-art semiconductor devices.

The book also offers valuable insight into modern radiation-hardening techniques. The text begins by providing important background information on radiation effects. Both MOS and bipolar devices and associated circuits are prone to the radiation effects of either short-term or long-term nature.

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Presented at the 4th International Workshop on Radiation Effects on Semiconductor Devices for Space Application, Tsukuba, Japan, OctoberRadiation Damage of Electronic and Optoelectronic Devices in Space † A.

Johnston Jet Propulsion Laboratory, Oak Grove Drive Pasadena, California USA Abstract. This book analyzes the radiation problem, focusing on the most important aspects required for comprehending the degrading effects observed in semiconductor devices, circuits, and systems when they are irradiated.

It explores how radiation interacts with solid materials, providing a detailed analysis of three ways this occurs: Photoelectric. @article{osti_, title = {Radiation effects in optoelectronic devices. [Review]}, author = {Barnes, C E and Wiczer, J J}, abstractNote = {Purpose of this report is to provide not only a summary of radiation damage studies at Sandia National Laboratories, but also of those in the literature on the components of optoelectronic systems: light emitting diodes (LEDs), laser.

Ionizing Radiation Effects in Electronics: From Memories to Imagers delivers comprehensive coverage of the effects of ionizing radiation on state-of-the-art semiconductor devices.

The book also offers valuable insight into modern radiation-hardening : Tapa dura. the presented results originated in extensive studies of radiation effects in large scale particle detectors for the SSC and LHC.

Basic radiation damage mechanisms in semiconductor devices are described and specifically linked to electronic parameter changes in detectors, transistors and integrated circuits. Mitigation. Prompt-dose effects 59 Chapter 5: Radiation sensitivity by technology Total ionizing dose 63 Single-event effects 67 Chapter 6: Mitigating radiation effects in electronics Radiation robustness by serendipity 75 Radiation hardening by.

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The book also offers valuable insight into modern radiation-hardening techniques. The text begins by providing important. This book is targeted at researchers and graduate students in nuclear and space radiation, semiconductor physics and electron devices, as well as other areas of applied physics modelling.

Researchers and students interested in how a variety of physical phenomena can be modelled and numerically treated will also find this book to present helpful. Total-Dose Radiation Effects Data for Semiconductor Devices Supplement Keith E. Martin James R. Coss Charles A. Goben David C. Shaw Sam Farmanesh Michael M.

Davarpanah LeRoy H. Craft William E. Price Febru National Aeronautics and Space Administration Jet Propulsion Laboratory California Institute of Technology Pasadena, CaliforniaFile Size: 6MB. : Radiation Effects in Advanced Semiconductor Materials and Devices () by Claeys, C.; Simoen, E.

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The author covers faults and failures in ULSI devices induced by a wide variety of radiation fields, including electrons, alpha-rays, muons, gamma rays, neutrons and heavy ions. Readers will learn how to make numerical models from. This book analyzes the radiation problem, focusing on the most important aspects required for comprehending the degrading effects observed in semiconductor devices, circuits, and systems when they are irradiated.

F Guide for Use of an X-Ray Tester (10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits Military Specifications MIL-STD, MethodIonizing Radiation (Total Dose) Test Method Available from the Standardization Documents Order Desk, Building 4, Section D, Robbins Ave., Philadelphia, PA.

NEPP Webex Presentation –Radiation Effects presented by Kenneth A. LaBel– Single Event Effects (SEEs) • An SEE is caused by a single charged particle as it passes through a semiconductor material – Heavy ions • Direct ionization – Protons for sensitive devices • Nuclear reactions for standard devices • Effects on.

Radiation hardening is the process of making electronic components and circuits resistant to damage or malfunction caused by high levels of ionizing radiation (particle radiation and high-energy electromagnetic radiation), especially for environments in outer space and high-altitude flight, around nuclear reactors and particle accelerators, or during nuclear accidents or nuclear.

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for Semiconductor Devices” published by the United States Department of Defense) combine to fully pdf the scope of Radiation test requirements for discrete semiconductor part types. The following is a brief description of the key radiation tests detailed in these documents.

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